The RF2 near-field probe set consists of four passive near-field probes for measuring E-fields and magnetic fields from 30 MHz to 3 GHz on electronic assemblies during the development stage. The probe heads of the RF2 set allow for the step by step localization of RF magnetic-field interference sources on assemblies. The RF-R 400-1 and RF-R 50-1 probes can detect electromagnetic interference from greater distances. With their higher resolution, the RF-B 3-2 and RF-U 5-2 probes are designed to detect the interference sources more precisely. An electronic assembly´s field orientation and field distribution can be detected through specific use of the near-field probe. The near-field probes are small and handy. They have a current attenuating sheath and, therefore, are electrically shielded. They can be connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. They do not have an internal terminating resistance.
Scope of delivery
|Frequency range||30 MHz ... 3 GHz|
|Connector||SMB, male, jack|
Scope of delivery details
Due to its large diameter (25 mm) the RF-R 400-1 H-field probe is highly sensitive and is suitable for measurements at distances up to 10 cm around assemblies and devices.
The RF-R 50-1 H-field probe is designed for measurements at assemblies, devices, or cables at distances up to approx. 3 cm. The H-field probe can identify larger components as interference sources.
The RF-U 5-2 H-field probe is designed for detecting magnetical fields at broad conducting paths, cables, connectors, electronic components and their connections. The probe functions like a coupling clamp.
The measurement coil of the RF-B 3-2 H-field probe is set at a 90° angle to the probe shaft. By positioning the probe head vertically, the measurement coil touches the surface of the printed circuit board directly. This allows for use at places on the surface of printed circuit boards, which are typ…