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D10 set, EMC Demonstration Board
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CS-Scanner, ChipScan-Scanner Software / CD-ROM
CS-ESA set, ChipScan-ESA Software / CD-ROM
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EMV Boot Camp 2018
SF1, Experimental EMC Seminar - Interference Immunity 1
SF2, Experimental EMC Seminar - Interference Immunity 2
SA1, Experimental EMC Seminar - Emission 1
SA2, Experimental EMC Seminar - Emission 2
SF IHS, EMC Immunity Inhouse Seminar
SA IHS, Inhouse Seminar EMC Emission
Dates Overview
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EMC Workshops
WS ESA1, Workshop for Development System Emission
WS IC, EMC Workshop for Integrated Circuits
WS PCB, EMC-Workshop for Immunity and Emission
WS Scanner, Workshop for Langer Scanner
IC-EMC Analysis
Emission
Immunity
EMC Analysis of Plug-and-Socket Connectors and Cables
COCI, Measurement of the Coupling Inductance of Connectors and Cables
EMV-B, EMC-Consulting / Hour
EMC Know-How
Technical article Board-EMC
Basic Knowledge
Immunity
Emission
Technical article IC-EMC
Basic Knowledge
Immunity
Emission
Foreign technical article
Langer Near-field Probes in R&D worldwide
Newsletter
01 MFA micro probes and LVDS suppression
02 XF sniffer probes and LVDS suppression
03 Interference suppression on a direct-current motor controlled by PWM
04 Radiated Emissions at the PCB Level - An Introduction
05 Time and cost savings when recording and documenting RF measurements with a spectrum analyzer
06 Measuring the Shielding Effectiveness at IC Level with the IC Test System P1402/P1502
07 EMC Measurement Technology for Testing Integrated Circuits - An Introduction
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Technical article Board-EMC
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Foreign technical article
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