Measuring systems and EMC tools for emission analysis of assemblies and devices at the development stage
Measurement Technology for the Development Stage
Near-field probes are used for accompanying measurements of high-frequency, electric and magnetic RF fields on assemblies and devices. Technical parameters for the single probes are available from the respective product articles and from the overview PDF as a download.
Optical Signal Transmission
Langer EMV-Technik GmbH`s optical signal transmission systems are used for the floating transmission of signals from the device under test up to a distance of 20 m.