The FLS 106 IC scanner is a 4-axes positioning system that allows for the movement of ICR near-field probes along three linear axes and the rotation of the ICR near-field probes on one axis above an IC in its electronic assembly.
The ICR near-field probes allow for the measurement of high-frequency magnetic or E-fields up to 6 GHz with a high measuring resolution of 50 to 100 µm.
The IC scanner can be set up for surface scans and ESD or EFT immunity tests in a few simple steps.
Scope of delivery
- ICR Probe, Your selection from our range of near-field microprobes
- ICI 01 L-EFT set, IC EM Pulse Injection Langer Pulse
- XF Product family, Near-Field Probes 30 MHz up to 6 GHz
- SX1 set, Near-Field Probes 1 GHz up to 10 GHz
- PA 306 SMA, Preamplifier 100 kHz to 6 GHz
- SH 01, Probe Holder for Langer scanner
- UH DUT set, Universal Holder for Langer scanner
|Supply voltage||110 V / 230 V|
|x, y, z axes|
|Max. traverse distance||(400 x 600 x 120) mm / α-Rotation ±180°|
|Min. positioning distance||(20 x 20 x 20) µm / α-Rotation 1°|
|Positioning speed||(20 x 25 x 10) mm/s / α-Rotation 90°/s|
|Sizes (L x W x H)||(1030 x 775 x 900) mm|
Scope of delivery details
The FLS 106 4-axis positioning system is used to move near field probes in four axises and to rotate the near field probes above a DUT.
ChipScan-Scanner is an evaluation software designed for reliable acquisition, fast interactive visualization and sophisticated analysis of electromagnetic compatibility (EMC) measurements of components. In combination with a Langer IC-Scanner and one of Langer's ICR microprobes, ChipScan-Scanner is …
The GND 25 ground plane ensures the RF-compatible contacting of the probe during an EMC measurement at a test IC. The GND 25 consists of steel with a gold plated surface. The recess (103 mm x 103 mm) is designed for the placement of GNDA ground adapters (GNDA 01-04) and TEM cell prints (100 mm x 100 mm).
The digital microscope camera is an essential part of a Langer-Scanner and makes it easier to position the near-field probes above the DUT.