ICR HV Product Family
Near-Field Microprobes up to 6 GHz
Short description
The near-field microprobe is designed for high resolution measurement of magnetic near fields. With the ICR RF probes the following measurements can be done:
-Surface Scan via IC according to IEC 61967-3
-Volumenscan via IC
-PIN-Scan
The measuring coil within the ICR RF probe head is vertically aligned with the measurement surface.
A preamplifier is integrated into the probe casing and powered by the Bias-Tee.
The ICR near field probes undergo a quality check before they are delivered.
The measuring coil in the ICR -RF probe heads is positioned vertically to the measuring surface. A preamplifier is integrated into the probe casing and is powered by the Bias-Tee.
The ICR near field micro probes undergo a quality check before they are delivered. Different reference setup measurements are performed and a calibration curve is generated. Three different calibration curves are determined:
1)standardized calibration curve
2)H-field calibration curve
3)current calibration curve
Attention: Due to its construction, the ICR probe is sensitive to shock and the delivery includes shipping and handling protection.
Technical parameters
| Frequency range | (0.5 ... 6) GHz |
| Resolution | (60 ... 300) µm |