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P311 L-EFT

Voltage Generator up to 140 V Langer Pulse 1.5/20 ns

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  • P311 L-EFT, Voltage Generator up to 140 V Langer Pulse 1.5/20 ns
  • Measurement set up
    Measurement set up
P311 L-EFT, Voltage Generator up to 140 V Langer Pulse 1.5/20 ns Measurement set up
  • P311 L-EFT, Voltage Generator up to 140 V Langer Pulse 1.5/20 ns
  • Measurement set up
Short description

The probe is used to couple in grip bounded pulse current into the IC to be tested. It simulates attenuated disturbance current pulses at the IC input resulting from tests according to IEC 61000-4-2 / ICE 61000-4-4. During a test, disturbance current pulses can result above the magnetic fields .

If the electric field couples into the cable network of an IC to be tested, the voltage of the connected impedances will drop. This voltage drop applies at the IC pin can lead to interferences.
The coupling behaviour can be simulated by a high- ohm pulse voltage source. Therefore the P311 has a high internal resistance. The pulse voltage is adjustable in the range ± (5 - 140)V.
The probe is operated by the BPS 201 burst power station and the BPS-Client control software.
The measuring station of the IC to be tested needs the ICE1 test environment. Depending on the measuring task additional equipment is required (oscilloscope, PC).

Technical parameters
Internal resistance ≈ 100 Ω
Coupling capacity 18 pF
Pulse parameter
Shape 1.5 / 20 ns
Frequency 0.1 Hz - 20 kHz
Voltage ±(5 - 140) V
Inductance 50 nH
Sizes (L x W x H) (76 x 35 x 31) mm
Equivalent circuit Equivalent circuit Equivalent circuit
Pulse shape (measured) Pulse shape (measured) Pulse shape (measured)
Design, view 1 Design, view 1 Design, view 1