RF Coupling
These probes allow for conducted and radiated HF coupling into an IC.
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ICIM DPI
Measurement service IC Immunity Measurement Direct Power Injection (DPI) acc. IEC 62132-4
The ICIM DPI measurement service uses a method described in accordance with the IEC 62132-4 standard to measure the immunity of ICs to conducted RF disturbances, in the frequency range from 150 kHz to 1 GHz, caused for example by radiated RF disturbances. This method ensures high repeatability and g…
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P512
DPI Coupling Network and RF probe to 12 GHz
The DPI coupling network P512 is used for power injection (DPI) into IC pins according to IEC 62132-4. Due to the improved design of the probe tip, the probe can also be used as an RF probe and DPI investigations and RF measurements up to 12 GHz can be performed. The coupling capacity of the integra…
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P501 / P503 set
RF Power Injection IEC 62132-4 up to 3 GHz
The P501/P503 probe set is used for conducted measurements of immunity according to IEC 62132-4. The gained knowledge of immunity parameters allows the IC optimization as well as the definition of the application requirements. Available DPI couple networks (P501, P503) allow the RF coupling with dif…
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P503 set
RF Power Injection IEC 62132-4 up to 1 GHz
The P503 probe set is used for conducted measurements of immunity according to IEC 62132-4. The gained knowledge of immunity parameters allows the IC optimization as well as the definition of the application requirements.
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P1401 / P1501 set
RF Field Coupling up to 1 GHz
The RF field coupling up to 1 GHz probe set tests the ICs in terms of their immunity under the influence of RF magnetic fields (P1401) or RF E-fields (P1501). These analyzes are the basis for an EMC compatible development of ICs. Furthermore, the determined RF parameters are helpful for the IC user…
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P1402 / P1502 set
RF Field Coupling up to 3 GHz
The RF magnetic field injection up to 3 GHz probe set tests the ICs in terms of their immunity under the influence of RF magnetic fields (P1402) or RF-E-field (P1502). These analysises are the basis for an EMC compatible development of ICs. Furthermore, the detemined RF parameter are helpful for th…