The SX-R 20-1 is a passive H-field probe covering a frequency range up to 20 GHz. The probe head of the SX-R 20-1 is very compact. This allows the location of very small H-field sources, e.g. on traces, individual components or above an IC. It has a current attenuating sheath and is electrically shielded. The near-field probe can be connected to a spectrum analyzer or an oscilloscope with a 50 Ω input.