The SX1 set consists of three passive near-field probes for measuring E-fields and magnetic fields with a high clock frequency from 1 GHz to 10 GHz on electronic assemblies and ICs during the development stage. The different probe heads of the SX1 set allow for measurements very close to the electronic assemblies, e.g. on single IC pins, conducting paths, components, and connectors, in order to localize interference sources. An electronic assembly’s field orientation and field distribution can be detected through specific use of the near-field probe. The near-field probes are small and handy. They have a current attenuating sheath and, therefore, are electrically shielded. They can be connected to a spectrum analyzer or an oscilloscope with a 50 Ω input.
Scope of delivery
|Frequency range||1 GHz - 10 GHz|
|Connector||SMA, female, jack|
Scope of delivery details
With 4x4 mm dimensions, the electrode on the underside of the probe head of the SX-E 03 is very compact. This allows for the localization of very small E-field sources, e.g. at conducting paths, single components, or on printed circuit boards.
The measurement coil of the SX-B 3-1 H-field probe is set at a 90° angle relative to the probe shaft. By positioning the probe head vertically, the measurement coil directly touches the surface of the printed circuit board. It is therefore possible to measure even hard to reach spots on the printed …
With its small probe head, the SX-R 3-1 can detect very high resolution RF-magnetic fields and can, therefore, identify even the smallest components as interference sources. Furthermore, the small probe head is designed to allow for measurements at less accessible areas, e.g. near IC pins.