P603-1 / P750 set
RF Conducted Measurement IEC 61967-4, 1 Ohm / 150 Ohm
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Application with P603-1 -
Scheme measurement set-up with P750
Short description
The probe set is used to measure conducted emissions (measurements with direct 1 Ohm/150 Ohm-coupling) according to IEC 61967-4 at IC pins. For the current and voltage measurement there is one respective probe available. Every Test-IC pin can be reached and contacted by the probe.
Measurements performed with the probe set ensure high repeatability and comparability of the results.
The ICE1 IC test environment from Langer EMV-Technik is used to commission the test IC. Measurements can be carried out using the ChipScan-ESA software. The measurement results stored in the software for all measured pins can be compared quickly and systematically.
Scope of delivery
- 1x P603-1, RF Current Probe 1 Ohm
- 1x P750, RF Voltage Probe 150 Ohm
- 1x CS-ESA, ChipScan-ESA Software / USB
- 1x SMA-SMB 1 m, SMA-SMB Measuring Cable
- 1x NT FRI EU, Power Supply Unit
- 1x P603 / P750 case, System Case
- 1x P603-1 / P750 m, P603 / P750 Set User Manual
Recommended products
Scope of delivery details
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P603-1
RF Current Probe 1 Ohm
The P603-1 probe is a 1-Ω-probe for direct measurement of high frequency (RF) current at IC pins. It is used to measure at ground pins (Vss) and signal pins. The RF current probe 1 Ohm has a pin contact with which every IC pin can be separately contacted and measured.
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P750
RF Voltage Probe 150 Ohm
The P750 RF voltage probe corresponds to a 150 ohm coupling network according to IEC 61967-4 for the RF voltage measurement at IC pins. The P750 probe has of a high resistance, capacitive coupled input. RF voltages can be measured at different pins of the device under test.
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CS-ESA
ChipScan-ESA Software / USB
The ChipScan-ESA is a software used for the remote control of a spectrum analyzer. The software is delivered with an installation USB thumb drive. After installation, the full version in conjunction with a dongle (USB interface) is ready for operation.