The LF1 near-field probe set consists of four shielded near-field probes for measuring emissions of longwave, medium wave, and shortwave frequencies on electronic devices during the development process.
The probe heads of the LF1 set are designed for the incremental detection of electromagnetic interference sources at single pins, larger components, and on assemblies. First, the electromagnetic interference of the assembly is detected by the LF-R 400 probe from up to 10 cm. Probes with higher resolution like the LF-B 3, LF-U 5 and LF-U 2.5 are then used to more precisely detect any source of interference. Our near-field probes are small and handy. They have a current attenuating sheath and, therefore, are electrically shielded. They can be connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. The H-field probes do not have an internal terminating resistance of 50 Ω.
Scope of delivery
|Frequency range||100 kHz ... 50 MHz|
|Connector||SMB, male, jack|
Scope of delivery details
The LF-R 400 H-field probe has a large diameter (25 mm), which makes it highly sensitive and suitable for measurements within ranges up to 10 cm around assemblies and devices.
The measuring coil of the H-field probe LF-B 3 sits orthogonally to the shaft. Using the probe tip perpendicularly ensures its correct placement directly on the assembly or device to be measured. This allows for use at places on the surface of printed circuit boards typically hard to access, e.g. be…
The H-field probe LF-U 2.5 is a near-field probe. It is designed for the selective detection of RF current in conducting paths, SMD components and IC pins. The head of the probe has a magnetically active gap with a width of approx. 0.5 mm.
The H-field probe LF-U 5 is specially designed for detecting magnetic fields at wide conducting paths, cables, connectors, electronic components, cables and their connectors. The probe functions like a coupling clamp.