RFS-E 10
Scanner Probe 30 MHz up to 3 GHz
 
        				
        					
        						 
        					
        
        					Short description
The electrode underneath the RF-E 10 scanner probe head has a width of approx. 0.2 mm, which can locate even the smallest E-field sources, e.g. conducting paths with a width of 0.1 mm or, single IC pins at high pin ICs.
The RFS-E 10 is a passive near-field scanner probe. For measurements the E-field probe is positioned above the components or areas of the PC board. The near-field probe has a sheath current attenuation and is electrically shielded. It can be connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. The E-field probe does not have a 50 Ω terminating resistor internally.
 
           
          ![Frequency response [dBµV] / [dBµA/m]](/fileadmin/Bilder300/Disturbance emission_near field probe_RFS-E 10_frequency response_en_wGM.png?v=1761830853767) 
        									![E- field correction curve [dBµV/mm] / [dBµV]](/fileadmin/Bilder300/Disturbance emission_near field probe_RFS-E 10_E-field correction curve_en_wGM.png?v=1761830853767)