SX-E 03
E-Field Probe 1 GHz up to 10 GHz
 
        				
        					
        						 
        					
        
        					Short description
With 4x4 mm dimensions, the electrode on the underside of the probe head of the SX-E 03 is very compact. This allows for the localization of very small E-field sources, e.g. at conducting paths, single components, or on printed circuit boards.
The SX-E 03 is a passive near-field probe. To measure, the probe head is positioned directly onto the measured object, due to higher electrical field strength at the measured object. The near-field probe is small and handy. It has a current attenuating sheath and its upper side is electrically shielded. It can be connected to a spectrum analyzer or an oscilloscope with a 50 Ω input.
 
           
          ![Frequency response [dBµV] / [dBµV/mm]](/fileadmin/Bilder300/Disturbance emission_near field probe_SX-E 03_frequency response_en_wPZ.png?v=1761894007581) 
        									![E- field correction curve [dBµV/mm] / [dBµV]](/fileadmin/Bilder300/Disturbance emission_near field probe_SX-E 03_E-field correction curve_en_wPZ.png?v=1761894007581) 
        									