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Black cat logo Langer EMV-Technik

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    • PCB Immunity
      • Immunity Development System
      • Mini Burst Field Generators
      • Accessory EFT/Burst generators IEC 61000-4-4
      • Optical Signal Transmission
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    • PCB Emission
      • Measurement Technology for the Development Stage
      • Near-Field Probes
      • Preamplifier
      • Near-Field Microprobes
      • Optical Signal Transmission
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      • Fault Injection
      • Side-channel analysis
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    • Positioning Systems
      • Langer Scanner
      • Accessories for Langer Scanner
      • Near-field Scanner Probes
    • Software
      • CS-Scanner, ChipScan-Scanner Software / USB
      • CS-ESA set, ChipScan-ESA Software / USB
    • Measuring and Calibration Stations
      • PCB
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      • Connector
    • Equipment for Teaching and Training
      • EMC-Basic 1 set, Demonstration Boards Mini Burst Field Generators
      • EMC-Basic 2 set, Demonstration Boards Near-Field Probes
      • DB 20 set, Demo Board 20
      • D10 set, EMC Demonstration Board
  • Seminars
    • SF-GE, Experimental EMC Seminar - Interference Immunity - Basics & Troubleshooting (3 days)
    • SF-G, EMC Experimental Seminar - Interference Immunity-Basics (2 days)
    • SA-GE, Experimental EMC Seminar - Interference Emission - Basics and Troubleshooting (3 days)
    • SA-G, EMC Experimental Seminar - Interference Emission - Basics (2 days)
    • SF IHS, Experimental EMC Inhouse Seminar - Interference Immunity 3 days
    • SA IHS, Experimental EMC Inhouse Seminar - Emission 2 days
    • Dates Overview
  • Services
    • EMC Workshops
      • WS ESA1, Workshop for Development System Emission
      • WS IC, EMC Workshop for Integrated Circuits
      • WS PCB, EMC-Workshop for Immunity and Emission
      • WS Scanner, Workshop for Langer Scanner
    • IC-EMC Analysis
      • Emission
      • Immunity
    • EMC Analysis
      • SMM Langer, Measuring of electromagnetic Shielding according to Langer method
      • COCI, Measurement of the Coupling Inductance of Connectors and Cables
    • EMV-B, EMC-Consulting / Hour
  • EMC Know-How
    • Technical article Board-EMC
      • Basic Knowledge
      • Immunity
      • Emission
    • Technical article IC-EMC
      • Basic Knowledge
      • Immunity
      • Emission
    • Langer EMV-Technik in scientific research
    • Newsletter
      • 17 ESA1 set
      • 16 ICI-DP sets
      • 15 tent and GP 23 set
      • 14 Mini Burst Field Generators in pocket size
      • 13 Achieve interference immunity by identifying and eliminating EMC weak points:
      • 12 ICR: Near-field analysis in the micrometer range and its advantages
      • 11 ChipSan-ESA now supports more measuring devices
      • 10 P512 and DPI
      • 09 Surface Scan on IC Level with high Resolution
      • 08 ESD and Efficient Electronic Design
      • 07 EMC Measurement Technology for Testing Integrated Circuits - An Introduction
      • 06 Measuring the Shielding Effectiveness at IC Level with the IC Test System P1402/P1502
      • 05 Time and cost savings when recording and documenting RF measurements with a spectrum analyzer
      • 04 Radiated Emissions at the PCB Level - An Introduction
      • 03 Interference suppression on a direct-current motor controlled by PWM
      • 02 XF sniffer probes and LVDS suppression
      • 01 MFA micro probes and LVDS suppression
    • Videos
      • How-to videos
      • EMC Webinar
  • PCB Immunity
  • PCB Emission
  • IC Test System
  • IC Security
  • Positioning Systems
  • Software
    • CS-ScannerChipScan-Scanner Software / USB
    • CS-ESA setChipScan-ESA Software / USB
  • Measuring and Calibration Stations
  • Equipment for Teaching and Training
  • Products
  • Software
  • ESA1 set, Emission Development System
  • ESA1 case, System case

ESA1 case

System case

  • Short description
  • Technical parameters
Send enquiry Datasheet
Short description

The ESA1 is a system of EMC tools for the comparative measurement of interference emitted by assemblies and devices. The CS-ESA software, which is designed for the developer’s needs, is included for quick and easy-to-follow interference supression. ESA1 is designed for the developer’s work space. With the ESA1, interference measurements taken during the development stage are proportional to the results from far-field measurements or from measurements with artificial networks. With the ESA1 tools, disturbance sources can be localized, effects detected and suitable EMC measures determined and implemented. The effects of the improvements implemented with ESA 1 are proportional to the results of the far-field measurements.

Technical parameters
Weight 1,3 kg
Sizes (L x W x H) (410 x 330 x 81) mm
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