RF-U 2.5-2
H-Field Probe 30 MHz up to 3 GHz
![RF-U 2.5-2, H-Field Probe 30 MHz up to 3 GHz](/fileadmin/Bilder300/Disturbance emission_near field probe_RF-U 2.5-2_function_en_wPZ.png?v=1737097204109)
![Probe head](/fileadmin/Bilder300/2014.11.14 Sondenkopf RF-U 2,5-2_wPZ.jpg?v=1737097206701)
Short description
The RF-U 2.5-2 near-field probe is designed for the selective measurements of RF currents in conducting paths, component connectors, SMD components, and IC-pins. The probe head has a magnetically active gap with an approx. width of 0.5 mm. To use, the head should be positioned directly onto the measured object.
The RF-U 2.5-2 is a passive near-field probe that functions like the RF-U 5-2 probe, but is designed for SMD components (pins). The near-field probe is small and handy. It has a current attenuating steath and its upper side is electrically shielded. It can be connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. The H-field probe does not have an internal terminating resistance of 50 Ω.