The E1 is a set of EMC tools used for EMI suppression in printed circuit boards during the development phase. The developer can use the E1 set to quickly identify the causes of burst and ESD interference. This allows the developer to design suitable measures to solve the causes of the interference. It can also be used to test the effectiveness of the measures taken. The E1 test set-up is small and fits easily on a developer’s desk. The E1 set user manual describes EMC mechanisms and provides detailed descriptions of basic measuring strategies for interference suppression in printed circuit boards. The E1 set includes a generator to generate burst and ESD disturbances.
Scope of delivery
- 1x SGZ 21, Burst Generator
- 1x S21, Optical Sensor (10 Mbps)
- 1x BS 02, Magnetic Field Source
- 1x BS 04DB, Magnetic Field Source
- 1x BS 05D, Magnetic Field Source
- 1x BS 05DU, Magnetic Field Source
- 1x ES 00, E-Field Source
- 1x ES 01, E-Field Source
- 1x ES 02, E-Field Source
- 1x ES 05D, E-Field Source
- 1x ES 08D, E-Field Source
- 1x MS 02, Magnetic Field Probe
- 1x E1 acc, Accessories
- 1x NT FRI EU, Power Supply Unit
- 1x E1 case, System Case
- 1x E1 m, E1 Set User Manual
Scope of delivery details
The SGZ 21 burst generator generates floating, pulse shaped disturbance. Its outputs are seperated symmetrically and galvanically. SGZ 21 can be partially coupled to constructional parts, cables, shieldings, ground connections; directly in assemblies or indirectly via field sources of a device under…
The S21 sensor is a digital probe for nonreactive transmissions of binary signals out of the device under test during a burst testing. The sensor is positioned directly onto the PC board of the device under test and is powered by the device under test. In the sensor the digital signal is transformed…
The BS 02 magnetic field source is designed for localizing weak spots in the layout. It generates a B field bundle of > 5 cm in diameter and is suitable for extensive pulsing of housing surfaces and internal areas, connection technology and assemblies with conducting path structures and ICs. It det…
The BS 04DB generates a B field bundle in millimeter range and is specially designed to localize critical parts of conducting paths, components and component connectors. The field which emits from the field soures head is guided above the device under test.
The BS 05D generates a B field with a diameter > 3 mm. The field lines run at 90° to the field source. The field source is specially suitable for localizing weak spots between two printed circuit boards and in hard to reach spots of assemblies, e.g. between components. Before using the BS 05D, the w…
The BS 05DU generates a magnetic field in millimeter range. It functions like a couppling clamp and is used for selective coupling of disturbance current in single conducting paths, IC pins, SMD components and thin cables (flat ribbon cables).
ES 00 allows electric couplings, which are either large (150 cm²) or with the edge of the field source head also linear. E field sensitive weak spots often range extensively over 10 to 15 cm (LCD display; bus systems). Large field sources like ES 00 detect such weak spots. ES 00 can also be used fo…
The field source is suitable for pulsing planar or line shaped weak points in the range from 5 to 10 cm. It ranges between the field source ES 02 and ES 00. ES 01 can also be used for coupling disturbance current into assemblies.
The surface of the E field source head allows the extensive coupling into housing surfaces and interior areas, connection technology and assemblies with conducting path structures and ICs ( e.g. bus systems, LCD displays). Furthermore its tip can be used for the localization of small E- field sensit…
The E field source has a small line shaped coupling electrode in its field source head. Therefore it is suitable for positioning on conducting paths, small components and their connectors, wires and singe SMD components like resistors and capacitors. Single male contacts or cores of flat ribbon cabl…
The ES 08D E field source is a probe tip, which is used to determine the sensibility of an IC pin or a conductor. During the test the probe tip is bonded with the pin / conducting path. By changing the intenstity of the burst impulse at SGZ 21 the sensitivity of the pin is determined.
The magnetic field probe is designed for measuring bust magnetic fields within the device under test. The paths of the disturbance current can be detected. The MS 02 magnetic field probe is used together with SGZ 21.