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PCB Immunity
Immunity Development System
Mini Burst Field Generators
Accessory EFT/Burst generators IEC 61000-4-4
Optical Signal Transmission
Burstdetector
PCB Emission
Measurement Technology for the Development Stage
Near-Field Probes
Preamplifier
Near-Field Microprobes
Optical Signal Transmission
IC Test System
IC Test Environment
Emission
Immunity
Simulation
IC Security
Fault Injection
Side-channel analysis
Positioning systems
Positioning Systems
Langer Scanner
Accessories for Langer Scanner
Near-field Scanner Probes
Software
CS-Scanner, ChipScan-Scanner Software / USB
CS-ESA set, ChipScan-ESA Software / USB
Measuring and Calibration Stations
PCB
IC
Connector
Equipment for Teaching and Training
EMC-Basic 1 set, Demonstration Boards Mini Burst Field Generators
EMC-Basic 2 set, Demonstration Boards Near-Field Probes
DB 20 set, Demo Board 20
D10 set, EMC Demonstration Board
Seminars
SF-GE, Experimental EMC Seminar - Interference Immunity - Basics & Troubleshooting (3 days)
SA-GE, Experimental EMC Seminar - Interference Emission - Basics and Troubleshooting (3 days)
SF IHS, Experimental EMC In-house Seminar - Immunity 3 days
SA IHS, Experimental EMC In-house Seminar - Emission 3 days
Dates Overview
Services
EMC Workshops
IC-EMC Analysis
Emission
Immunity
EMC Analysis
SMM Langer, Measuring of electromagnetic Shielding according to Langer method
COCI, Measurement of the Coupling Inductance of Connectors and Cables
EMV-B, EMC-Consulting / Hour
EMC Know-How
Technical article Board-EMC
Basic Knowledge
Immunity
Emission
Technical article IC-EMC
Basic Knowledge
Immunity
Emission
Langer EMV-Technik in scientific research
Newsletter
IC EMC Parameters - Mechanisms of Interference Emission
Measurement Technology for IC Security: Langer Near-Field Probes in Practical Use
17 ESA1 set
16 ICI-DP sets
RF Injection – Practical Immunity Example – Review of EMV Cologne 2026
15 tent and GP 23 set
14 Mini Burst Field Generators in pocket size
13 Achieve interference immunity by identifying and eliminating EMC weak points:
12 ICR: Near-field analysis in the micrometer range and its advantages
11 ChipSan-ESA now supports more measuring devices
10 P512 and DPI
09 Surface Scan on IC Level with high Resolution
08 ESD and Efficient Electronic Design
07 EMC Measurement Technology for Testing Integrated Circuits - An Introduction
06 Measuring the Shielding Effectiveness at IC Level with the IC Test System P1402/P1502
05 Time and cost savings when recording and documenting RF measurements with a spectrum analyzer
04 Radiated Emissions at the PCB Level - An Introduction
03 Interference suppression on a direct-current motor controlled by PWM
02 XF sniffer probes and LVDS suppression
01 MFA micro probes and LVDS suppression
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EMC Webinar
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