扫描探头（30MHz-3GHz）
RFS扫描探头组包含三个无源近场探头，用于在研发阶段扫描测量电场和磁场，频率范围为30MHz到3GHz。该探头组的探头可以实现紧贴电子模块测量，从而定位干扰信号源。它们记录受测物的近电场和近磁场的整个图形。该扫描探头组具备外片电流衰减和电屏蔽。扫描探头可以接到频谱分析仪或示波器的50Ω输入端。探头内部没有50Ω的终端阻抗。扫描探头的测量信号可以通过PA 203或PA 303型前置放大器放大。根据需求生产RFS，LFS，SXS 和XFS型扫描探头。
They are designed for frequency ranges of 30 MHz to 3 GHz. The probe heads of the RFS set allow for close measurements needed to correctly localize interference sources on an electronic assembly. They document the whole image of the device under test`s near field.
The scanner probes have a sheath current attenuation and are electrically shielded. They are connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. They do not have an internal terminating resistance. The measuring signal can be increased with PA 203 or PA 303 preamplifier. On request further LFS, RFS, XFS, and SXS scanner probes are available.
| 频率范围 | 30 MHz ... 3 GHz |
| 接口 | SMA, male, jack |
扫描探头 （30MHz-3GHz）
RFS-B 3-2型磁场探头的测量线圈安置在垂直于探头柄的位置。如此可以更好地靠近组装件的探头，从而获得高耦合性。 RFS-B 3-2 采集垂直于被测件的磁感线，而不采集在探头侧边出现的磁感线。
扫描探头（30MHz-3GHz）
RFS-E 03型探头底部的电极大小约为 4 x 4 mm。 如此可以定位电缆、IC引脚或更小组件中的电场。
扫描探头（30MHz - 3GHz）
LF-R 50型磁场探头适用于检测约3cm范围内的组装件、设备或电缆。这种磁场探头会把较大的元件识别为干扰源。
You can download the correction data for our special magnetic field probe types as xlsx-file.
And for User of our software "ChipScan" ( older versions than 3.0) please download here the correction data in fdi-format.