XF-R 400-1
磁场探头(30MHz-6Hz)
 
        				
        					
        						 
        					
        
        					Short description
XF-R 400-1磁场探头 因较大的直径(25mm)而拥有很高的灵敏度,允许在10cm以内的距离测量模块和设备。
The XF-R 400-1 is a passive near-field probe. In principle it has the same structure as the XF-R 100-1 and XF-R 3-2 probes. The near-field probe is small and handy. It has a current attenuating sheath and, therefore, is electrically shielded. It can be connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. The H-field probe has an internal terminating resistance.
 
           
          ![频率特性 [dBµV] / [dBµA/m]](/fileadmin/Bilder300/Disturbance emission_near field probe_XF-R 400_frequency response_en_wPZ.png?v=1761894007581) 
        									![磁场校正曲线 [dBµA/m] / [dBµV]](/fileadmin/Bilder300/Disturbance emission_near field probe_XF-R 400_H-field correction curve_en_wPZ.png?v=1761894007581) 
        									![电流校正曲线 [dBµA] / [dBµV]](/fileadmin/Bilder300/Disturbance emission_near field probe_XF-R 400_current correction curve_en_wPZ.png?v=1761894007581) 
        									