MFA-K 0.1-30 set
近场微型探头(1MHz-1GHz)



Short description
该近场微型探头可以测量磁场频率在1GHz以内的磁场,例如在信号线、SMD-元器件(0603-0201)以及集成电路引脚上的磁场。因探头结构特殊,探测不到相邻导线产生的作用于探头侧面的磁场。该MFA型近场微型探头可以手持操作。因其分辨率高而性能优异。
在探头上集成有一个放大器。放大器(9V,100mA)由BT 706型偏置器供电。偏置器的阻抗为50欧姆。近场探头通过706型偏置器与频谱分析仪或者示波器相连。
Langer 电磁兼容科技有限公司的近场探头提供配套的修正曲线。利用修正曲线可以将探头输出减压换算为相应的磁场或电路中的电流。
The hand-guided, high resolution MFA-K 0.1-30 is an active magnetic field micro probe that requires the BT 706 bias tee to operate. The near-field micro probe is used to measure magnetic fields up to 1 GHz especially at signal conductors (150 µm) or IC pins.
In principle it has the same structure as the MFA-K 0.1-12, differing only in its frequency response.
Due to the special probe head design, magnetic fields which impinge the probe head laterally, e.g. from adjoining conductors, are not detected.
The direction of the coil is marked on the probe head with a black dot.
An amplifier stage is integrated into the probe head. The amplifier stage (9 V, 100 mA) is powered via the bias tee. It has an impedance of 50 Ω. The near-field micro probe is connected to a spectrum analyzer or oscilloscope with a 50 Ω input via the BT 706 bias tee. A power supply unit and the bias tee are included in the scope of delivery. With the help of the correction lines, the probe’s output voltage is converted into either the respective magnetic field or the current running through the conductor.
The near-field micro probe is small and handy. It has a current attenuating sheath and is electrically shielded.
Delivery content
- 1x MFA-K 0.1-30, 微型近场探头(1MHz-1GHz)
- 1x BT 706, T型偏置器
- 1x SMA-SMA 1 m, SMA-SMA 测量电缆
- 1x MFA acc
- 1x MFA case, System case