Near Field Probe Set XF 1 to 6 GHz
The probes from the XF1 set have electrically shielded probe heads which are designed for special magnetic field measurements on electronic assemblies, components and IC pins.
The passive probes are connected to the 50 Ohm input of a spectrum analyser via SMA and allow comparative measurements of magnetic fields and disturbance currents in the frequency range from 30 MHz to 6 GHz.
- Near Field Probe Set XF 1
Contents:
- H-Field Probe XF-R 400 - 1
- H-Field Probe XF-R 3 - 1
- H-Field Probe XF-U 2.5 - 1
- H-Field Probe XF-B 3 - 1
- E-Field Probe XF-E 10
- Cable SMA-SMA
- Case (240 x 185 x 50) mm
- Short instruction