The ChipScan ESA software helps
- compare and
disturbance emission measurements.
The free DEMO version is available at:
Some selected characteristics are described in the following:
Little management effort:
All curves measured for a device under test are saved in a single file. This file can be easily reloaded for later measurements and these measurements simply added.
Easy comparison of measured values:
All measured curves can be shown in a single diagram. You can choose between a two and a three-dimensional representation of the curves.
Individual curves can be faded in and out as you like – ideal for a fast comparison of certain modifications on the device under test or different measurement set-ups.
The measured curves can be labelled and coloured as well as faded in and out in
the Data Manager.
Measurements in different frequency ranges can be displayed simultaneously. This feature is suitable for a fast re-measurement of critical frequency ranges at a changed bandwidth, for example.
Measurements can be taken with different devices and the results can be displayed simultaneously. Please refer to this PDF file for the measurement devices which are currently supported by the ChipScan ESA.
The measured results can be exported as an image or Excel file at any time. This refers to individual measurements and random combinations of measured curves.
The measured original values are retained in any case irrespective of the chosen representation.
The most important device settings can be implemented for all connected devices via the standard user-interface of the ChipScan ESA.
Easy connection of the measuring devices:
Measuring devices can be connected via different interfaces. The ChipScan ESA is able to find and recognise them automatically.
Several measuring devices can be connected simultaneously. Simply select the desired device from the list of connected devices and assign a name for even more comfort.