ICR Near Field Microprobes up to 6 GHz

Application:

Measuring magnetic or electric near field close by the surface of an IC.

Properties:

The dimensions of the probe tips are in the micrometer range. Thanks to their high measuring resolution they can be used to examine near-fields on ICs (die surface, bond wires, pins). They move approximately a couple of µm above the respective device under test and allows to detect E- and H-near field at a high resolution.

• The near-field probes are microprobes which due to their high resolution and sensitivity could no longer be guided by hand, but have to be manual or automatic controlled by a mover.
• The E- and H-probes are mounted at the tip of the probe - the probe‘s head. An amplifier is integrated in the probe case.
• The probe holder can alternatively be adapted to the customer‘s existing mover or robot systems as desired.
• Near-field microprobes can be delivered for a wide variety of measurement tasks during development work. The portfolio of probe types allows the user to make an optimum choice for a wide range of practical measurement purpose.