• Overwiev IC measurement
• IC Testboard
• • IC Testboard
• Emission - line conducted
• • RF measurement P600/700
• Emission - field coupled
• • RF near-field measurement P1601/1701
  • ICR near-field microprobes
  • Langer IC scanner
• Immunity - line-conducted
• • P200/300 for conducted injection
  • P331/-2 for ESD injection
  • P250 for EFT injection
  • P500 for RF injection
• Immunity - field coupled
• • P1202-2 / P1202 / P1301 for EDS field injection
  • P1202-4 / P1302-4 for EFT field injection
  • P1401 / P1501 for RF field injection
• Components
• • OA 4005
  • TH 21
  • SGA

The probe tip holder can be used for measurements up to around 3 GHz.
The frequency is generally limited by the probe head used.
The rubber band fixation enables the use of a wide variety of different probe tip shapes. Internal magnets ensure the fixation on the GND plane.