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Partner Area
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Contact
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Policy
IC measurement
Overwiev IC measurement
IC Testboard
IC Testboard
Emission - line conducted
RF measurement P600/700
Emission - field coupled
RF near-field measurement P1601/1701
ICR near-field microprobes
Langer IC scanner
Immunity - line-conducted
P200/300 for conducted injection
P331/-2 for ESD injection
P250 for EFT injection
P500 for RF injection
Immunity - field coupled
P1202-2 / P1202 / P1301 for EDS field injection
P1202-4 / P1302-4 for EFT field injection
P1401 / P1501 for RF field injection
Components
OA 4005
TH 21
SGA
Disturbance Immunity
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Disturbance Emission
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IC measurement
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EMC data
SGA - Sloping ground adapter for probes
SGA 30
SGA 45
Description "IC test system components"
(pdf, 194 kb)