• IC-Test Board
• • IC Test Board
• RF Measurement on PIN
• • Probes Emission
  • Probes Immunity
• IC-Near Field Measuring (Emission)
• • ICR Near-field Microprobes
  • Langer IC scanner
  • IC H-Field Probe 1601
  • IC E-Field Probe 1701
• Fast transient/burst immunity
• • Probes for conducted injection
  • Probes for field injection
  • Burst Power Station
• Components
• • OA 4005
  • TH 21
  • CU 22

The levels (H, L) of two signals can be manually controlled with the control unit.
The power supply of the test IC can be manually interrupted with a pushbutton (quick break) or toggle switch.