• Measuring System
• • Development System E1
  • E1 - B- Field Sources
  • E1 - E- Field Sources
  • E1 - Magnetic Field Probes
• MINI-Burst Generators
• • Pulser P 1
• Accessories for generators under EN 61000-4-4
• • Field Source Sets
  • Burst Transformer
• Optical Signal Detection
• • OSE digital
  • Optical Fibre Probes
  • CAN 100
  • LIN 100
• Burst Detectors
• • BD 01B, 01E, 06B, 11

Oscillographing signals under extreme disturbance influence!

• Small senors convert logic signals into light signals
• Non-reactive transmission via optical fibre
• Connection to each oscillograph with BNC input
• Discover disturbed signals under burst and ESD influence
• Suitable for signal monitoring in anechoic chambers
• EMC optimization of hard- and software

Application:

Connect the receiver to an oscilloscope via a BNC plug-and-socket connector for data acquisition. Attach the sensors to the EUT using microcleps. We recommend fixing the measuring set-up with a glued-on socket (which is glued to the base) to ensure reproducible measurements. Place this socket in the vicinity of the digital signal to be monitored (generally an IC pin). Use a Cu enamelled wire to connect the sensor pins to the supply voltage, ground and signal lead (digital sensor input) by the shortest possible path avoiding wire loops. This is the only way to eliminate any disturbance voltage induction and distortion of measured values. Connect the sensor to the optical receiver via an optical fibre (Ø 2.2 mm). This allows you to monitor the digital signal without interaction with the EUT even under the influence of extreme disturbances. Detected disturbance pulses are displayed as a digital event on the oscilloscope through OSE optical signal detection at the pulse stretching set on the receiver. You can also use the system to monitor signals of an EUT under the influence of RF radiation. This enables you to observe critical signals on the oscilloscope outside the anechoic chamber. As a developer you are thus able to identify disturbance immunity weak spots and make targeted EMC measurements based on an analysis of the disturbed signals.