MINI-Burst Generators Set P 1

Technical data:

Pulser	P 11 Magnetic	P 12 Clip-on probe Magnetic	P 21 Electric
Field strength	ap. 1mT	ap. 1mT	ap. 100 KV/m
Pulse rise time adjustable	2 ns - 8 ns
Pulse frequency adjustable	single impuls or 5 kHz
Pulse polarity	switchable
Dimension	118 x 24 x 13 mm
Weight	30 g
Battery	1,5 Volt Micro

B-Pulser P11

The magnetic field source generates a very fine B-field beam, which is emitted from the tip of the probe (Ø > 1 mm). It is suitable for localizing spread and point-shaped weak points. The surface of printed circuit boards and components is scanned with the field beam. Due to the small diameter and the sharp focussing of the beam, a high resolution is possible. Critical conducting path sections, components and component connections can be localized.

: Type P11

: Application P11

B-Pulser P12

The magnetic field source generates a very smallcircular magnetic pulse field (millimeter range). It can be placed upon individual conducting paths. IC pins, SMD components and thin lines (ribbon cables) as mini clip-on probe for the selective injection of interference currents and interference voltages.
A unit (unit under test) often has many insensitive and few sensitive signal connections (conducting paths, IC pin). The sensitive ones can be identified quickly with the probe and be protcted by corresponding layout changes.

: Design P12

: Application P12

E-Pulser P21

The E-field source has a narrow, linear-shaped probe head and is designed for detecting weak points in the conducting path and component area of units. It is suitable for E-field injection on conducting paths, wires, pins and components; especially on individual SMD components such as resistors and capacitors. For the E-field injection, the probe is placed with its linear-shaped head upon individual conducting paths, SMD- or wired components. Individual plug-in contacts and individual cores of ribbon cables can also be examined.

: Design P21

: Application P21

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