MINI-Burst Generator Set P 1
Generation of local burst/ESD-equivalent pulse fields with an extreme field intensity.
Conventional generators and test stations can be used to determine whether a device complies with the standard disturbance immunity values required by law. Weak spots cannot be precisely located on a module.
Detailed information about the weak spot's location, susceptibility and type of action (E or B field susceptibility) are required to eliminate them at their place of action on the board in the most straightforward way.
The E and B pulsers contained in the P1 set generate a local pulse field of extreme intensity and steepness at the probe tip. This pulse field corresponds to the field which develops under the influence of burst and ESD processes on electronic modules. Weak spots can be located and their type (E/B field) and sensitivity can be determined through the locally emitted E or B fields.
The pocket-size mini-burst generators are always at hand. Electronic developers can use them at their workplace at any time to perform tests without any lengthy preparations.
- MINI-Burst Generators
