E 1 - Magnetic Field Sources

BS 02

The magnetic field probe generates a B field bundle of > 5 cm in diameter. It is suitable for both device and module examinations. Depending on its size, the probe allows disturbances to be applied to large areas of housing surfaces and internal areas, connection material and modules with conducting tracks and ICs and magnetically sensitive weak points to be determined.

BS 04 DB

The field probe generates a B field bundle in the millimetre range (approx. 3 mm). The field beam emitted from the probe's end can be use to scan the surface of circuit boards. This allows you to locate magnetic weak points in the layout and loading range. Critical conducting track sections, components and component connections can be localized.

BS 05 D

The magnetic field probe generates a B field bundle of approx. 3 mm in diameter similar to the BS 04 DB probe. However, the field lines run at 90° to the probe shaft. The probe is thus particularly suitable for localizing weak points in hardly accessible regions of modules. Before using the BS 05 D field probe you should roughly localize the weak point with the BS 02 or BS 04 DB probe.

BS 05 DU

The magnetic field probe generates a circular magnetic field in the millimetre range. It can be used as a mini-coupling clamp to couple disturbance current selectively into individual conducting tracks, IC pins, SMD components and thin leads (flat ribbon cables). A module (EUT) often has many insusceptible and only some susceptible signal connections (conducting tracks, IC pins). You can use the field source to quickly determine the susceptible ones and protect them by an appropriate layout design.