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E 1 - Electric Field Sources

ES 00 | ES 01ES 02 | ES 05 D | ES 08 D


 

ES 00

 

This field source can be used for electrical coupling into large areas or line-shaped regions (1.5 dm²). Electrically susceptible weak points often extend over areas of 10 to 15 cm of a module (LCD display, bus systems). These weak points do not respond to small field sources. You need large-area field sources such as the ES 00 to localize such weak points. You can also use the source for coupling into housings.

Type ES 00
Type ES 00
Application ES 00
Application ES 00


 

ES 01

 

This field source can be used for large-area electrical coupling. The probe is suitable for applying disturbances to area- or line-shaped weak points with a size between 5 and 10 cm. It ranges between the field sources ES 02 and ES 00 (see relevant description) because the ES 02 source may be too small and the ES 00 source too big for various applications.

Type ES 01
Type ES 01
Application ES 01
Application ES 01


 

ES 02


The E field source with its tip can be used to localize E field susceptible small-space weak points (conducting tracks, quartzes, pull-up resistors, ICs). The area of the field source allows coupling into large areas of housing surfaces and inner sections, connecting material and components with conducting track structures and ICs (e.g. bus systems, LCD displays).

Type ES 02
Type ES 02
Application ES 02
Application ES 02

 

ES 05 D

 

The E field source has a narrow line-shaped probe head and is designed for weak point localization in the conducting track and component area of modules. It is suitable for coupling E fields into conducting tracks, components and their connectors, wires and particularly into individual SMD components such as resistors and capacitors. Place the probe's head on individual conducting tracks, SMD or wired components for E field coupling. You can also examine individual plug contacts or cores of flat ribbon cables.

Type ES 05 D
Type ES 05 D
Application ES 05 D
Application ES 05 D


 

ES 08 D

 

This Probe is designed to quantify the immunity of IC-Pin and tracks – especially at very small structures. The tip of the probe has to be connected to the Pin or track. By changing the intensity of the burst generator the sensitivity can be defined.
Inside of the probe the burst pulse couples to the probe tip by a capacitor (ca. 1pF).

Type ES 08 D
Type ES 08 D
Application ES 08 D
Application ES 08 D

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