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Disturbance Immunity Development System E1

Type SGZ 21
Type SGZ 21
Application SGZ 21
Application SGZ 21

 

Burst Generator SGZ 21

 

The SGZ 21 is based on the pulse-rate procedure. In connection with a sensor that is included in the E 1 disturbance immunity development system, this procedure enables you to assess modifications to the unit under test within a second and thus considerable shortens the development time. A counter with optical input is integrated into the SGZ 21 to evaluate the sensor signals.

 



Type  S 31
Type S 31
Application  S 31
Application S 31

Sensor S31

 

The S31 sensor for disturbance threshold and signal detection is monitoring critical logic signals from the pcb.

 



Type MS02
Application MS02

 

Probe MS02

 

The MS02 probe enables the measurement of the magnetic burst fields to track the disturbance current.


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