Disturbance Immunity Development System E1
The equipment under test (EUT) needs modification if functional faults occur in burst and ESD pulse tests (IEC 61000-4-2 and IEC 61000-4-4) on electronic modules and devices.
The E1 development system is used to quickly and precisely determine the causes of functional faults within the EUT. The user is able to find out how and why the individual conducting tracks and components are influenced. This allows him/her to initiate the optimum corrective action directly on the circuit or in the layout.
The SGZ 21 burst generator generates the necessary test pulses which are coupled into the EUT via galvanic connections or via magnetic or electric field sources. Signals can be monitored with a S31 sensor and disturbance currents measured within the EUT during the tests.
- Burst Generator SGZ 21
- EMC Sensor S31 with OFP
- Case with foamed plastic inset
- Magnetic field probe MS 02
- Magnetic field source BS 02
- Magnetic field source BS 04 DB
- Magnetic field source BS 05 D
- Magnetic field source BS 05 DU
- E-field source ES 00
- E-field source ES 01
- E-field source ES 02
- E-field source ES 05 D
- E-Field Source ES 08 D