Field Sources for Generators according to EN 61000-4-4

Description BS 02

The magnetic field source generates a B-field bundle with a diameter > 5 cm. It is suited for both device and module tests. According to the probe size large shell surfaces and internal areas, bonding systems, modules with conductor structure and ICs can be pulsed and thus magnetic sensitive imperfections can be tracked.

Description BS 04 DB

This field source generates a B-field bundle with a range of millimeter s (diameter > 3 mm). The surface of printed circuit boards is scanned with the field beam emerged at the front of the probe. This allows the elimination of magnetic imperfections in the layout and insertion range. Critical sections of conductors, components and component connections can be located.

Description BS 05 DB

The magnetic field source generates a very fine B-field beam (diameter > 1 mm) emerging from the probe tip. Thereby it is suited for the localization of point imperfections. The surface of printed circuit boards and components is scanned with the field beam. The small diameter and the high degree of focusing allows a high resolution.Locate the imperfection coarsley with the probe BS 02 or BS 04 DB before using the field source BS 05 DB.

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Description BS 05 DU

The magnetic field probe, type BS 05 DU, generates a tiny circular pulsating magnetic field (millimeter range). It can be plced onto individual conductors, IC pins, SMD components, thin wires (flat band cable) as mini coupling tongs for selective interference current and voltage excitation. A module (test piece) has often a large number of insensitive and some few sensitive signal connections (conductors, IC-pins). The sensiticve ones can be quickly detected by the probe and may be protected by appropriate layout changes.

Description ES 00

Large-surface electrical excitation is possible with this source (1.5 dm²). Electrically sensitive imperfections often extent two-dimensionally across 10 up to 15 cm of a module (LCD display, bus systems). These imperfections do not react on small field sources. Large-surface field sources such as the ES 00 are required to detect imperfections.

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Description ES 01

With this field source, large-surface electric couplings are possible. The probe is suited for the pulsing of sensitive areas in the range between 5 and 10 cm and can be ranked between field source ES 02 and ES 00 (see belonging description). For this application, the cource ES 02 might be too small and the ES 00 too large.

Description ES 02

With its tip, the E-field probe can be used for the localization of electric-field-sensitive small imperfections (conductors, quartzes, pull-up resistors, ICs). The surface of the field source is intended for large-surface excitation of shell surfaces and interior spaces, bonding system and modules with conductor structures and ICs (e.g. bus systems, LC displays).

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Description ES 05 D

The E-field source has a narrow  lentiform probe head and is intended for imperfection tracking in the conductor and component range. It is especially suited for the E-field excitation of conductors, wires, pins and components, especially for individual SMD components such as resistors and capacitors. For purpose of E-field excitation, the probe is placed onto individual conductors, SMD or wired components. Also individual plug contacts or individual conductors of flat band cables can be tested.

Description ES 08 D

This Probe is designed to quantify the immunity of IC-Pin and tracks – especially at very small structures. The tip of the probe has to be connected to the Pin or track. By changing the intensity of the burst generator the sensitivity can be defined.Inside of the probe the burst pulse couples to the probe tip by a capacitor (ca. 1 pF).