EMC-Scanner probes
The scanner probes detect magnetic and electrical near fields quite simply and precisely. They are superior to hand-held near field probes because all development states can be documented and the improvements exactly evaluated through complete imaging of the near field.
Type of construction:
- electrically and/or magnetically shielded passive probe heads
- the active probe can be used with a 30 dB preamplifier
- probe body output with SMA-connector system on RG 174 cable basis
Fields of application:
- to detect modules, layout areas featuring critical frequencies
- to locate and evaluate magnetic and electric fields as vector quantities
- to determine emission sources, coupling mechanisms and functional chains
- to document, compare and evaluate module modifications
- to check the quality in the production process
Available scanner probe heads RFS-R 50, RFS-B 3 and RFS-E 3:
