Near field probes - type XF
Frequency range: 30 MHz - 6 GHz
Magnetic field probe XF-R 400 - 1
On account of its large diameter (25 mm) this near field probe is the most sensitive in our range of products. It can be used at a distance of up to 10 cm from the units. The probe detects the spatial distribution of HF magnetic fields in devices and assemblies and allows the user to draw conclusions with regard to disturbance emissions.
- Diameter approx. 25 mm
- Frequency range
- H field correction characteristic
Magnetic field probe XF-R 3 - 1
The near field probe is designed for the detection of HF magnetic fields with a high geometrical resolution. The field orientation and distribution can be detected by moving the probe around conductor runs, bypass capacitors, EMC components and within IC pin and supply system areas.
- Resolution approx. 1 mm
- Frequency range
- H field correction characteristic
Magnetic field probe XF-U 2.5 - 1
The near field probe is designed for the selective detection of RF currents in conductor runs, component connections, capacitors and IC pins. The probe head has a magnetically active curb with a width of approx. 0.5 mm. The probe‘s curb is positioned on conductor runs, ICs or capacitor connections for a measurement.
- Resolution approx. 0.5 mm
- Frequency range
- Current correction characteristic
Magnetic field probe XF-B 3 - 1
The near field probe is designed for the detection of magnetic fields which are emitted vertically from the surface of PCBs and is thus ideal for investigating current loops. The probe allows the measurement in confined board areas (between large controller components, for example).
- Resolution approx. 2 mm
- Frequency range
- Current correction characteristic
E field probe XF-E 04 s
The near-field probe can detect electric fields which are emitted by clocked lines and smaller ICs via their surfaces. The probe's shielded electrode surface prevents any interference to the measured results by neighbouring fields and its sensitivity allows measurements at a certain distance (0.5 mm to 10 mm) above the electronic module.
- Electrode surface area: approx. 5x5 mm
- Frequency ranges
E field probe XF-E 09 s
The near-field probe detects electric fields which are emitted via the surface of multi-pole ICs. The probe's shielded electrode surface prevents any interference to the measured results by neighbouring fields and its sensitivity allows measurements at a certain distance (0.5 mm to 10 mm) above ICs and electronic modules.
- Electrode surface area: approx. 10x10 mm
- Frequency ranges
E field probe XF-E 10
The near field probe detects electrical fields which are emitted from the surface of clocked leads. The probe head‘s tip is only 0.5 mm wide. Its integrated shielding prevents neighbouring leads from interfering with the measurement result. A resolution of approx. 0.2 mm is possible so that each individual conductor run can be evaluated in the layout.
- Electrode surface area: approx. 0.5x2 mm
- Frequency range
