Near field probes - type RF
Frequency range: 30 MHz - 3 GHz
Magnetic field probe RF-R 400 - 1 Frequency range 30 MHz to 3 GHz
On account of its large diameter (25 mm) this near field probe is the most sensitive in our range of products. It can be used at a distance of up to 10 cm from the units. The probe detects the spatial distribution of HF magnetic fields in devices and assemblies and allows the user to draw conclusions with regard to disturbance emissions.
- Diameter approx. 25 mm
- Frequency range
- H field correction characteristic
Magnetic field probe RF-R 50 - 1 Frequency range 30 MHz - 3 GHz
The near field probe has a higher resolution and a lower sensitivity than the R 400-1. It is suitable for measurements up to 3 cm. Interference sources can be localised by detecting the distribution and orientation of the field, therefore enabling a more exact use of higher resolution probes.
- Diameter approx. 10 mm
- Frequency range
- H field correction characteristic
Magnetic field probe RF-R 3 - 2 Frequency range: 30 MHz to 3 GHz
The near field probe is designed for the detection of HF magnetic fields with a high geometrical resolution. The field orientation and distribution can be detected by moving the probe around conductor runs, bypass capacitors, EMC components and within IC pin and supply system areas.
- Diameter: approx. 3 mm
- Frequency range
- H field correction characteristic
Magnetic field probe RF-R 0.3 - 3 Frequency range 30 MHz to 3 GHz
The near field probe serves the high-resolution detection of spatial RF magnetic fields. The loop opening, which is marked by a white dot, is manually turned for the recognition of field orientation and intensity. If the loop opening is orthogonally permeated by the field, a maximum can be determined. The minimum can be determined by pivoting the loop opening 90°. This allows the detection of H field distribution (orientation and intensity) by guiding the probe in the vicinity of components, between and over track runs, in the pin area of ICs, on block capacitors, EMC components, etc (resolution < 1 mm).
- Diameter approx. 2 mm
- Frequency range
- Current correction characteristic
Magnetic field probe RF-B 3 - 2 Frequency range 30 MHz to 3 GHz
The near field probe is designed for the detection of magnetic fields which are emitted vertically from the surface of PCBs and is thus ideal for investigating current loops. The probe allows the measurement in confined board areas (between large controller components, for example - resolution approx. 2 mm).
- Diameter approx. 4 mm
- Frequency range
- Current correction characteristic
Magnetic field probe RF-B 0.3 - 3 Frequency range 30 MHz to 3 GHz
The near field probe detects a magnetic field, which enters the probe point vertically. It is therefore suitable for pin-point detection of RF magnetic fields, which are emitted by surfaces. For this, the probe point is applied to the surface in question. Due to its very small construction, magnetic field distributions of under 1 millimeter can be resolved on IC housings and PCB surfaces, for example. The probe enables measurement in hard-to-reach places, such as between components.
- Diameter approx. 2 mm
- Frequency range
- Current correction characteristic
Magnetic field probe RF-U 5 - 2 Frequency range 30 MHz to 2 GHz
The near-field probe acts like a current clamp. It detects the current which generates the field via the magnetic field circulating around a single conductor or conductor bundle. It is used for very wide conductor runs (Resolution approx. 5 mm). Thanks to the respective correction factors it is possible to deduce the current flowing in the conductor from the measured probe voltage. No conversion is necessary for comparative measurements.
- Dimension approx 6x6 mm
- Frequency range
- Current correction characteristic
Magnetic field probe RF-U 2.5 -2 Frequency range: 30 MHz to 3 GHz
The near field probe is designed for the selective detection of RF currents in conductor runs, component connections, capacitors and IC pins. The probe head has a magnetically active curb with a width of approx. 0.5 mm. The probe‘s curb is positioned on conductor runs, ICs or capacitor connections for a measurement.
- Diameter: approx. 4 mm
- Frequency range
- Current correction characteristic
Magnetic field probe RF-K 7 - 4 Frequency range: 30 MHz to 1 GHz
The near field probe detects contra-orientated magnetic fields within the two halves of the probe’s head; these can be the circular magnetic fields of larger objects such as IC substrates and wide conducting paths. The effect of homogeneous fields is sufficiently compensated for by the probe’s special head. The probe is especially suitable for detecting the non-homogeneous fringe magnetic field of flat units (Resolution: approx. 5 mm)
- Dimension: approx. 6x10 mm
- Frequency range
- Current correction characteristic
E field probe RF-E 02 Frequency range: 30 MHz - 1.5 GHz
Bus structures, larger components respectively supply areas couple out electrical fields by their surfaces. These electrical fields may be involved electromagnetic emission. The near field probe detect these fields by the probe bottom on an area of 2x5 cm approximately. For measuring the probe bottom is approached respectively putted on the Unit Under Test. Higher resolutions can be obtained if the probe tip is inclined at an angle of 45° when approaching the source.
- Dimension approx. 20x50 mm
- Frequency range
E field probe RF-E 05 Frequency range: 30 MHz - 3 GHz
By this probe you are able to register selectively electrical fields on layout and component area of flat units. The breadth of the field electrode is about 1 mm and to exist on the bottom side. Therefore you can locate electrical fields very exactly (Resolution: 0,6 mm conductor). These electrical fields are caused by clocked lines, IC pins and small components.
- Dimension: approx. 1x8 mm
- Frequency range
E field probe RF-E 10 Frequency range: 30 MHz to 3 GHz
The near field probe detects electrical fields which are emitted from the surface of clocked leads. The probe head‘s tip is only 0.5 mm wide. Its integrated shielding prevents neighbouring leads from interfering with the measurement result. A resolution of approx. 0.2 mm is possible so that each individual conductor run can be evaluated in the layout.
- Dimension approx. 0.5x2 mm
- Frequency range
E field probe RF-E 09 Frequency range: 30 MHz to 3 GHz
The near-field probe detects electric fields which are emitted via the surface of multi-pole ICs. The probe's sensitivity allows measurements at a certain distance (0.5 mm to 10 mm) above ICs and electronic modules.
- Electrode surface area: approx. 10x10 mm
- Frequency range
E field probe RF-E 04 Frequency range: 30 MHz to 3 GHz
The near-field probe can detect electric fields which are emitted by clocked lines and smaller ICs via their surfaces. The probe's sensitivity allows measurements at a certain distance (0.5 mm to 10 mm) above the electronic module.
- Electrode surface area: approx. 5x5 mm
- Frequency range
back