MFA-R
The MFA-R probes have been developed for measurements on the smallest SMD components (0603-0201) on PCBs. Even very fine conductor runs and SMD or IC pins can be measured. The probe voltage can be converted into the respective magnetic field or the current flowing in the conductor with the correction data.

- Device probe MFA-R

- Device probe MFA-R

- Application probe MFA-R

- Frequency range probe MFA-R 0.2-75

- Frequency range probe MFA-R 0.2-6
The two MFA probes allow measurements
in special frequency ranges:
MFA-R 0.2-75: 1 MHz to 1 GHz
MFA-R 0.2-6: 100 MHz to 6 GHz
Resolution: 300 µm
Use with: BIAS TEE
MFA-K
The design of the type K MFA probe simulates a current clamp. This probe type is thus able to measure currents on fine conductor runs and IC pins. Other magnetic field components from the vicinity are ignored in detection.

- Device probe MFA-K

- Frequency range probe MFA-K
Probe MFA-K 0.1-12
Frequency range: 100 MHz to 6 GHz
Resolution: 200 µm
Use with: BIAS TEE
Bias-Tee BT 706

All MFA near-field probes have an integrated amplifier stage in their probe heads. This bias tee has an impedance of 50 ohm and stabilises the current (9 V, 100 mA) for the MFA near-field probe.
Frequency range: 500 kHz to 6 GHz
Connection: SMA connector
Plug-in power supply unit 12 V / 70 mA (included in delivery)

