Near field probes - type LF
Frequency range: 100 kHz - 50 MHz
Magnetic field probe LF-R 400
On account of its large diameter (25 mm) this near field probe is the most sensitive in our range of products. It can be used at a distance of up to 10 cm from the units. The probe detects the spatial distribution of HF magnetic fields in devices and assemblies and allows the user to draw conclusions with regard to disturbance emissions.
- Diameter approx. 25 mm
- Frequency range: output voltage of the probe at 50 Ohm for 1 A measured RF current
Magnetic field probe LF-R 50
The near field probe has a higher resolution and a lower sensitivity than the R 400-1. It is suitable for measurements up to 3 cm. Interference sources can be localised by detecting the distribution and orientation of the field, therefore enabling a more exact use of higher resolution probes.
- Diameter approx. 10 mm
- Frequency range: output voltage of the probe at 50 Ohm for 1 A measured RF current
Magnetic field probe LF-R 3
The near field probe is designed for the detection of HF magnetic fields with a high geometrical resolution. The field orientation and distribution can be detected by moving the probe around conductor runs, bypass capacitors, EMC components and within IC pin and supply system areas.
- Diameter approx. 3 mm
- Frequency range: output voltage of the probe at 50 Ohm for 1 A measured RF current
Magnetic field probe LF-K 7
The near field probe detects contra-orientated magnetic fields within the two halves of the probe´s head; these can be the circular magnetic fields of larger objects such as IC substrates and wide conducting paths. The effect of homogeneous fields is sufficiently copmpensated for by the probe´s special head. The probe is especially suitable for detecting the non-homgeneous fringe magnetic field of flat units (Resolution approx. 5 mm).
- Dimension approx. 6x10 mm
- Frequency range: output voltage of the probe at 50 Ohm for 1 A measured RF current
Magnetic field probe LF-U 5
The near field probe is designed for detecting surface and circular magnetic fields on very wide conducting paths, metallized surfaces, plug-and-socket connectors, electronic components, cables and component connectors (Resolution approx. 5 mm). The probe functions like a coupling clamp.
- Dimension 6x6 mm
- Frequency range: output voltage of the probe at 50 Ohm for 1 A measured RF current
Magnetic field probe LF-U 2,5
The near field probe is designed for the selective detection of RF currents in conductor runs, component connections, capacitors and IC pins. The probe head has a magnetically active curb with a width of approx. 0.5 mm. The probe‘s curb is positioned on conductor runs, ICs or capacitor connections for a measurement
(Resolution approx. 2 mm).
- Diameter approx. 4 mm
- Frequency range: output voltage of the probe at 50 Ohm for 1 A measured RF current
Magnetic field probe LF-B 3
The near field probe is designed for the detection of magnetic fields which are emitted vertically from the surface of PCBs and is thus ideal for investigating current loops. The probe allows the measurement in confined board areas (between large controller components, for example - Resolution approx. 2 mm).
- Diameter approx. 4 mm
- Frequency range: output voltage of the probe at 50 Ohm for 1 A measured RF current
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