EMC Measurement on IC
Measuring station for conducted coupling of RF power into ICs (DPI method)
Direct coupling of RF power for disturbance immunity testing at the P500 automatic measuring station.
Conducted coupling of RF power up to 3 GHz into the IC; use of the DPI method (IEC 62132-4 and BISS).
- Block diagram of the P500 Measuring station
The usual DPI measuring station is extended by a P500 probe. The RF power is coupled into the IC via the pin contact of the P500 probe. Any pin of the IC can be contacted and tested with the pin contact. The IC is supplied, controlled and monitored via the IC adapter in the GND plane. In addition to power measurements (power meter), the P500 probe measures the time characteristics of the injected RF current and RF voltage. The current and voltage characteristics are further processed by an oscilloscope. This calculates the phase angle and effective values.
This is particularly beneficial for IC development. The current and voltage characteristics allow you to recognize the opening of current paths (diodes).
- Cross section of the P500 Measuring station
The measuring station has a power regulator with which the RF power is gradually increased at predefined frequency increments. Faults are detected automatically and the values obtained are recorded in an Excel and an ODBC database.