EMC Measurement on IC
Measuring station for pulse disturbances (burst, ESD)
The measuring station is used to determine the immunity of ICs to pulse disturbances. The immunity of PCBs and electronic devices to burst and ESD disturbances is the practical background of this measurement. These are subjected to a burst and ESD test (IEC norm 61000-4-2/61000-4-4). The test voltages are in the kV range. The ICs themselves have much lower disturbance levels.
The pulse voltages which are applied to the outside of the device are attenuated on their way to the IC. Voltages of several kV outside of the device are reduced to voltages of around 1 ... 100 V at the IC input. The generators of the P200 and P300 series simulate these attenuated pulses.
Two types of pulse generators are required to measure these pulses:
Direct coupling of pulse currents (P200)
The P200 pulse current generator simulates the coupling of burst and/or ESD magnetic fields into PCBs.