Participation in trade fairs & exhibitions
EMC Compo 2011
November 06 - 09, 2011
Centre for Advanced Academic Studies
University of Zagreb
Dubrovnik / Kroatien
8th International Workshop
on Electromagnetic Compatibility of Integrated Circuits
electronic environment 2011
April 05 - 06, 2011 - Stockholm / Sweden
Nordic conference and exhibition for EMC, ESD and Electrical Safety as well as Mechanical and Thermal Environments.
Workshop - EMC:
"Disturbance immunity - Eliminating disturbance immunity faults of electronic devices"
(Ref. Dipl.-Ing. (BA) Sven König, LANGER EMV-Technik GmbH)
EMV 2011 Stuttgart
March 15 - 17, 2011 Fair Stuttgart / Stand C2-202
Mr. Shingo Arai (Testram, Japan)
visit the stand of Langer EMV-Technik
LANGER EMV-Technik
stand A1-128
- New: MFA01-active near-field probes to 6 GHz
EMV 2010 - Fair Düsseldorf
March 09 - 11, 2010
We show our news at the stand CCD-216.
EMC Compo 2009
November 17 - 19, 2009
Hotel Mercure ATRIA
Toulouse, France
7th International Workshop
on Electromagnetic Compatibility of Integrated Circuits
5th GMM - Symposium
October 21 - 22 , 2009
"Automotiv technology - EMC"
BMW-Welt - Munich
SEMICON Europe 2009
October 06 - 08, 2009
Neue Messe Dresden, Germany
Hall 4 / Stand 4.536
We show:
Measurement equipments to determine properties of EMC from IC and ASIC.
- ERETEC distributors visit the stand of Langer EMV-Technik.
EMV 2009 Stuttgart
March 10 - 12, 2009
Fair Stuttgart
Stand C2-202
electronica 2008
November 11 - 14, 2008
Neue Messe Munich / A1-126
- ESD-field measurement set-up
EMV 2008 - Fair Düsseldorf
February 19 - 21, 2008
We show our news at the stand CCD-307.
- The Managing Director Mr. Gunter Langer presents the latest IC measuring places of LANGER EMV-Technik.
- Measurement place for RF current measurement on IC pin.
EMC COMPO 2007
November 28-30, 2007
Torino, Italy
6th International Workshop
on Electromagnetic Compatibility of Integrated Circuits
Presentation of the LANGER IC scanner ICS 103
EMV 2007 Stuttgart
March 6 - 8, 2007
Fair Stuttgart
Stand 6-1-108
New EMC measurement technique for IC takes over central role at the fair.
- EMC cases
- Langer IC scanner
- Dr. Schubert explains EMC measuring with Langer IC scanner ICS 103.
electronica 2006
November 14 - 17, 2006
Neue Messe Munich
- Mr. Maag and Mr. Wacker from ROSCHI ROHDE & SCHWARZ AG
- Chairmann & CEO Mr Jun-Sun Park and Senior Sales Manager Mr Yeon-Soo Han meeting General Manager Mr. Gunter Langer and his team at the EMV fair 2006 in Düsseldorf.
EMV 2006 Düsseldorf
March 7 - 9, 2006
Fair Düsseldorf
Hall 1 Stand E08
- Intensive consultation at the fair stand.
measurement 2006
February 15 - 16, 2006
Göttingen
International Trade Fair with Workshops on Electromagnetic Compatibility.
Mr Georg Dude and Mr Peter Michak explain to visitors the development accompanying measurement of the E1 system.
EMC Compo 2005
5th International Workshop on Electromagnetic Compatibility of Integrated Circuits
November 28 - 30, 2005
Munich
4th GMM - Symposium
October 26 - 27, 2005
"Automotiv technology - EMC"
Audi AG, Ingolstadt
- Mr. Hacker demonstrates our new IC-XYZ-Scanner.
EMV 2005 Stuttgart
International Trade Fair with Workshops on Electromagnetic Compatibility
Stuttgart, Germany
March 15 - 17, 2005
ELECTRONICA
21st International Trade Fair for Components and Assemblies in Electronics
Neue Messe Munich
November 9 - 12, 2004
- Mr Langer demonstrates our new IC Test System.
- Mr Hacker explains a visitor our Development System for Disturbance Immunity E1.
- Mr Zschoche talks to a visitor at our exhibition stand.