EMC Measurement on IC
EMC measurements according to BISS / IEC
We support norm measurements on ICs in compliance with BISS / IEC. Our measuring set-up features shunts and voltage dividers which are separate from the DUT circuit board and part of a probe which can be moved freely and brought into contact with the pins. All pins are thus freely accessible. BGAs are mounted on the rear of the DUT circuit board and contacted with the probe through vias. We support the following measurements:
Measuring method | acc. to IEC norm | Probe | Station | ||
|---|---|---|---|---|---|
Emission | 1. | 150 / 1 Ohm Method | 61967-4 | ||
2. | TEM Cell Method | 61967-2 | |||
3. | Surface Scan Method | 61967-3 | ICS103 | ||
Immunity | 4. | Direct Power Injektion (DPI) | 62132-4 | ||
5. | TEM Cell Method | 62132-2 |
The firm of Langer provides automatic measuring stations for the aforementioned measurements on ICs. Measurements according to the DPI method in particular require a lot of hardware and measuring time. A measuring set-up that works automatically is thus necessary for efficiency reasons.
Please do not hesitate to contact us. We will be pleased to offer our advice and make you an appropriate offer.