Milestones
1980
| Basic EMC research for electronic modules
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1993
| Start of EMC counseling in industry
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1994
| Research in the field of zum technological protection and modules against burst disturbances
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1996
| The E1 disturbance immunity development system is launched on the market
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1997
| Development of our first digital optical measuring systems in the OSE series
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1998
| Magnetic field sources and electric field sources for burst generators in accordance with EN 61000-4-4
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2000
| Production of our first analogue optical measuring systems in the A series
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2001
| Research work into disturbance immunity problems for automotive electronics
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2002
| The ESA1 disturbance emission development system is launched on the market
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2003
| Presentation of the EMC-IC test system for RF-compatible current and voltage measurement and feeding of burst currents and voltages into separate pins
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2004
| Supplier of near field probes for the firm of Rohde & Schwarz GmbH & Co. KG
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2005
| Market introduction of magnetic field probes for IC scanner with an outer diameter of 150 µm
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2007
| Expansion of the analogue optical measuring system up to a bandwidth of 500 kHz (A200)
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2008
| New ICR near-field microprobes for IC scanners up to 6 GHz with an inside diameter of 100 µm
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2009
| Certification of the company as a provider of advanced vocational training
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2010 | Frequency expansion of the near-field probe product group up to 6 GHz |